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non-volatile memory element, a non-volatile storage device, method of manufacturing a nonvolatile memory element, and the manufacture of non-volatile storage device how

机译:非易失性存储元件,非易失性存储设备,制造非易失性存储元件的方法以及非易失性存储设备的制造方法

摘要

non-volatile memory element (20), a first electrode (105), second and two electrodes (107), a first electrode (105) is interposed between the second electrode (107), the first resistance variable layer to be connected to the first electrode (105) and (1061), the second electrode a second resistance variable layer (1062) and the resistance variable layer formed by stacking to be connected to the (107) (106), which has an oxygen barrier property, coating the side surface of the resistance variable layer (106) with sidewall protection layer (108), the first resistance variable layer (1061) comprises a first metal oxide and (106a), is formed around the first metal oxide and a first metal oxide object (106a) than is composed de third metal oxide oxygen shortage degree is small and (106c), the second of the resistance change layer (1062), the lack of oxygen level than the first metal oxide (106a) and a second metal oxide is small (106b).
机译:非易失性存储元件(20),第一电极(105),第二和两个电极(107),第一电极(105)插在第二电极(107)之间,第一电阻可变层连接到第一电极(105)和(1061),第二电极,第二电阻变化层(1062)和通过堆叠形成的电阻变化层连接到具有氧气阻隔性的(107)(106),从而涂覆在具有侧壁保护层(108)的电阻变化层(106)的侧面上,第一电阻变化层(1061)包括第一金属氧化物和(106a),形成在第一金属氧化物和第一金属氧化物物体周围( (106a)比第三金属氧化物(106c)的氧缺乏度小,第二电阻变化层(1062)的氧含量比第一金属氧化物(106a)和第二金属氧化物的氧少。 (106b)。

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