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METHOD AND DEVICE FOR LOCALIZING A DEFECT IN AN ELECTROCHEMICAL STORE AND DEFECT LOCALIZATION SYSTEM

机译：在电化学存储和缺陷定位系统中定位缺陷的方法和设备

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摘要

The invention relates to a method for localizing a defect in an electrochemical store (165). The method includes a step of controlling the temperature of a subarea (145, 150, 155, 160, 170) of the electrochemical store (165) to increase an internal pressure of the subarea (145, 150, 155, 160, 170), a step of detecting a measured value which represents an escape of a component from the subarea (145, 150, 155, 160, 170) occurring in response to the increased internal pressure of the subarea (145, 150, 155, 160, 170), and a step of localizing the defect in the subarea (145, 150, 155, 160, 170) when the measured value is in a predetermined relation to a comparison value.

机译：本发明涉及一种在电化学存储器（ 165 ）中定位缺陷的方法。该方法包括控制电化学存储器（ 165 ）的子区域（ 145、150、155、160、170 ）的温度以增加内部压力的步骤。在子区域（ 145、150、155、160、170 ）中，检测测量值的步骤，该测量值表示组分从子区域（ 145、150、155、160， 170 ）是由于子区域（ 145、150、155、160、170 ）的内部压力升高而发生的，以及将缺陷定位在子区域（ 145、150、155、160、170 ）时，测量值与比较值之间存在预定关系。 展开▼

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公开/公告号US2015090009A1

专利类型

公开/公告日2015-04-02

原文格式PDF

申请/专利权人 KATHY SAHNER;JENS GRIMMINGER;DIRK LIEMERSDORF;
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申请/专利号US201314394334

发明设计人 KATHY SAHNER;JENS GRIMMINGER;DIRK LIEMERSDORF;
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申请日2013-03-07

分类号G01M3;G01R31/36;

国家 US

入库时间 2022-08-21 15:23:06

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