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Integrated circuit design method for improved testability
Integrated circuit design method for improved testability
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机译:集成电路设计方法,以提高可测试性
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摘要
A display device is provided with a display panel; and a display panel driver driving the display panel in response to externally-provided image data. The display panel driver includes a display memory for storing the image data, and is configured to perform overdrive processing on the image data read from the display memory. The display panel driver includes an overdrive processing control circuit detecting writing of the image data into the display memory to control operation and halt of a circuit used for the overdrive processing.
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