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Copper leadframe finish for copper wire bonding

机译:铜引线框架表面处理,用于铜线键合

摘要

A semiconductor device (100) includes a leadframe having a chip pad (110) and a lead (111) with a first end (112) proximate to the pad and a second end (113) remote from the pad, the leadframe having a base metal (120) including copper and a stack of a plated first layer (121) of nickel in contact with the base metal and a plated second layer (122) of a noble metal in contact with the nickel layer, the second lead end free of the noble metal. Further included is a copper wire (104) having a ball bond (104a) on a semiconductor chip (101) attached to the chip pad, and a stitch bond (104b) on the proximate lead end, the stitch bond penetrating the second layer; furthermore a packaging compound (130) encapsulating the chip, the wire, and the first end of the lead, the compound leaving the second end of the lead un-encapsulated; and the unencapsulated second lead end covered with a plated third layer (123) of solder.
机译:半导体器件( 100 )包括具有芯片焊盘( 110 )的引线框架和具有第一端( > 112 )靠近焊盘和远离焊盘的第二端( 113 ),引线框具有贱金属( 120 ),包括铜和与贱金属接触的镍电镀第一层( 121 )和与镍层接触的贵金属电镀第二层( 122 )的叠层,第二个引线末端不含贵金属。还包括在半导体芯片( 101 )上具有球形键( 104 a )的铜线( 104 ) >)固定在芯片焊盘上,并在最靠近的引线端上缝制键合( 104 b ),该缝制键合穿透第二层;此外,封装化合物( 130 )封装芯片,导线和引线的第一端,该化合物使引线的第二端未封装。未封装的第二引线端覆盖有镀锡的第三层( 123 )焊料。

著录项

  • 公开/公告号US9059185B2

    专利类型

  • 公开/公告日2015-06-16

    原文格式PDF

  • 申请/专利权人 TEXAS INSTRUMENTS INCORPORATED;

    申请/专利号US201313939328

  • 发明设计人 DONALD C. ABBOTT;

    申请日2013-07-11

  • 分类号H01L21/82;H01L21/56;

  • 国家 US

  • 入库时间 2022-08-21 15:20:53

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