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Pre-patterned hard mask for ultrafast lithographic imaging
Pre-patterned hard mask for ultrafast lithographic imaging
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机译:预先构图的硬掩模,用于超快光刻成像
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摘要
A method of fabricating a substrate including coating a first resist onto a hardmask, exposing regions of the first resist to electromagnetic radiation at a dose of 10.0 mJ/cm2 or greater and removing a portion of said the and forming guiding features. The method also includes etching the hardmask to form isolating features in the hardmask, applying a second resist within the isolating features forming regions of the second resist in the hardmask, and exposing regions of the second resist to electromagnetic radiation having a dose of less than 10.0 mJ/cm2 and forming elements.
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机译:一种制造衬底的方法,该方法包括在硬掩模上涂覆第一抗蚀剂,以10.0 mJ / cm 2 Sup>或更大的剂量将第一抗蚀剂的区域暴露于电磁辐射中,并除去所述部分和形成引导特征。该方法还包括蚀刻硬掩模以在硬掩模中形成隔离特征;在隔离特征内施加第二抗蚀剂,以形成硬掩模中的第二抗蚀剂的区域;以及将第二抗蚀剂的区域暴露于剂量小于10.0的电磁辐射。 mJ / cm 2 Sup>和成形元件。
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