首页> 外国专利> Method for correcting count rate drift in a quantum-counting detector, an X-ray system with a quantum-counting detector and a circuit arrangement for a quantum-counting detector

Method for correcting count rate drift in a quantum-counting detector, an X-ray system with a quantum-counting detector and a circuit arrangement for a quantum-counting detector

机译:校正量子计数探测器中计数率漂移的方法,具有量子计数探测器的X射线系统以及用于量子计数探测器的电路装置

摘要

A method, a circuit arrangement and an X-ray system, in particular a CT system, are disclosed wherein, in order to correct the count rate drift of a detector for ionizing radiation having quantum-counting detector elements which include a combination of at least two counters with significantly different energy thresholds, and on the basis of previously determined functional dependencies of count rates on one another and using at least one of the counters per detector element as the reference, the count rates of the respective other counters with different energy thresholds are corrected.
机译:公开了一种方法,电路装置和X射线系统,特别是CT系统,其中,为了校正用于电离辐射的具有量子计数检测器元件的检测器的计数率漂移,所述量子计数检测器元件包括至少以下各项的组合两个具有明显不同的能量阈值的计数器,并且基于先前确定的计数率彼此之间的功能依赖性,并使用每个检测器元件中的至少一个计数器作为参考,具有不同能量阈值的各个其他计数器的计数率被纠正。

著录项

  • 公开/公告号US9075153B2

    专利类型

  • 公开/公告日2015-07-07

    原文格式PDF

  • 申请/专利权人 STEFFEN KAPPLER;

    申请/专利号US201213483326

  • 发明设计人 STEFFEN KAPPLER;

    申请日2012-05-30

  • 分类号G01T1/40;A61B6/03;

  • 国家 US

  • 入库时间 2022-08-21 15:17:51

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号