首页> 外国专利> Method for correcting a counting rate drift in a quantum-counting detector, X-ray system with quantum-counting detector and circuit arrangement for a quantum-counting detector

Method for correcting a counting rate drift in a quantum-counting detector, X-ray system with quantum-counting detector and circuit arrangement for a quantum-counting detector

机译:校正量子计数检测器中的计数率漂移的方法,具有量子计数检测器的x射线系统以及用于量子计数检测器的电路装置

摘要

Method for correcting a counting rate drift in a detector for ionizing radiation with a multiplicity of areally arranged quantum counting detector elements (D), each detector element (D) comprising a combination of at least two counters (Z, Z, Z) with significantly different energy thresholds (S1, S2 , S3), which are evaluated in combination to determine an incident radiation dose, and on the basis of previously determined functional dependencies of counting rates among themselves and using at least one of the counters (Z, Z, Z) per detector element as a reference, the count rates of the other counter be corrected with different energy threshold, characterized in that the functional dependencies of the count rates of the individual counters (Z, Z, Z) of each detector element (D) while irradiating the identical or with respect to its absorption properties equivalent material of different thickness, which also in a later X-ray examination in the test object to be examined (7) is at least approximately present, measured and the count rates of the detector elements per energy threshold are attenuation-dependent corrected.
机译:用多个平面排列的量子计数探测器元件(D)校正用于电离辐射的探测器中计数率漂移的方法,每个探测器元件(D)包括至少两个计数器(Z,Z,Z)的组合结合使用不同的能量阈值(S1,S2,S3)来确定入射辐射剂量,并基于先前确定的函数间相互依赖的计数率并使用至少一个计数器(Z,Z, Z)以每个检测器元件为基准,以不同的能量阈值校正另一个计数器的计数率,其特征在于每个检测器元件(D)的各个计数器(Z,Z,Z)的计数率的功能依赖性)在辐照相同或关于其吸收特性的等效材料时,要使用不同厚度的等效材料,在随后的X射线检查中,被测物体(7)至少应大约存在,测量和每个能量阈值的检测器元件的计数率均取决于衰减。

著录项

  • 公开/公告号DE102011076781B4

    专利类型

  • 公开/公告日2018-05-03

    原文格式PDF

  • 申请/专利权人 SIEMENS HEALTHCARE GMBH;

    申请/专利号DE20111076781

  • 发明设计人 STEFFEN KAPPLER;

    申请日2011-05-31

  • 分类号G01T1/29;A61B6/03;

  • 国家 DE

  • 入库时间 2022-08-21 12:35:07

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号