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Mass analyzer apparatus and systems operative for focusing ribbon ion beams and for separating desired ion species from unwanted ion species in ribbon ion beams

机译:质量分析仪设备和系统,可用于聚焦带状离子束,并从带状离子束中将所需离子种类与有害离子种类分离

摘要

The present invention is an apparatus and multi-unit assembly which is able to achieve two different and highly desirable functions: A focusing of a charged particle beam; and a mass separation of desired ion species from unwanted ion species in traveling ion beams. The apparatus is a simply organized and easily manufactured article; is relatively light-weight and less expensive to make; and is easier to install, align, and operate than conventionally available devices.
机译:本发明是一种设备和多单元组件,其能够实现两种不同且非常期望的功能:带电粒子束的聚焦;在行进离子束中将所需的离子种类与不需要的离子种类进行质量分离。该设备是一种简单组织且易于制造的物品;重量相对较轻,制造成本较低;并且比传统的可用设备更容易安装,对准和操作。

著录项

  • 公开/公告号US8921802B2

    专利类型

  • 公开/公告日2014-12-30

    原文格式PDF

  • 申请/专利权人 NICHOLAS R. WHITE;

    申请/专利号US201213385618

  • 发明设计人 NICHOLAS R. WHITE;

    申请日2012-02-27

  • 分类号H01J3/20;H01J37/14;H01J3/22;H01J3/24;H01J37/05;H01J37/317;H01J49/06;H01J49/20;

  • 国家 US

  • 入库时间 2022-08-21 15:17:13

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