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Error detection or correction of stored signals after one or more heat events in one or more memory devices
Error detection or correction of stored signals after one or more heat events in one or more memory devices
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机译:在一个或多个存储设备中发生一个或多个热事件后,对存储的信号进行错误检测或纠正
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摘要
In some embodiments, a non-volatile memory device comprises an error correction component to re-program at least a portion of a non-volatile memory array at least in part in response to detection of one or more heat events and detection of one or more errors in contents of the at least a portion of the non-volatile memory array.
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