A method of testing a short circuit protection system applied to a spur of an electric circuit in which the short circuit protection system comprises a current limiting means which applies a current limit to said spur if the current thereon exceeds a spur current trip level in which the electric circuit comprises a power supply and an isolation means adapted to fully or partially isolate the power supply from the electric circuit if the current thereon exceeds a power supply trip level for longer than a deadband period in which said method comprises the following steps: i) applying a test current demand to said short circuit protection system which has a current and duration sufficient for said spur current trip level to be exceeded but a current insufficient for said power supply trip level to be exceeded and/or a duration insufficient to exceed said deadband period ii) detecting if the current limiting means applies said current limit or not during said test current demand.
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