PROBE UNIT FOR TESTING PANEL HAVING MICRO PITCH ARRAY

摘要

The present invention relates to a probe unit for inspecting a panel having a fine pitch, in which a pad electrode of a liquid crystal panel and an output lead of a driving chip for inspection simply elastically contact each other to perform electrical inspection. The probe unit for inspecting the panel having the fine pitch is a probe unit for inspecting a panel, which electrically inspects a liquid crystal panel including a plurality of pad electrodes for mounting a driving chip on an edge thereof. The probe unit comprises: a base film on which a connection pattern, to which an electrical signal for electrically inspecting the liquid crystal panel is applied, is formed; a driving chip for inspection, on which an input lead and an output lead, each of which has the same pattern as the driving chip, are formed and which is mounted on the base film so that the input lead contacts the connection pattern; a contact unit which directly contacts the output lead of the driving chip for the inspection to connect the pad electrode of the liquid crystal panel to the output lead of the driving chip for the inspection; and a body block which has a bottom surface to which the driving chip for the inspection and the base film are fixed.