首页> 外国专利> APPARATUS FOR INSPECTING WARPAGE OF BOARD-LIKE BODY AND METHOD FOR INSPECTING WARPAGE OF BOARD-LIKE BODY

APPARATUS FOR INSPECTING WARPAGE OF BOARD-LIKE BODY AND METHOD FOR INSPECTING WARPAGE OF BOARD-LIKE BODY

机译:板状体的翘曲检查装置及板状体的翘曲检查方法

摘要

An apparatus for inspecting warpage of a sheet-like member includes a conveyance device for conveying a glass substrate in a substantially horizontal attitude and a non-contact displacement meter for measuring a distance to a surface of the glass substrate. The apparatus is configured to preset an upper limit waveform and a lower limit waveform based on an ideal waveform of surface shape displacement of the glass substrate in a conveyance direction, which is determined based on a characteristic of the conveyance device; and determine whether or not an actual waveform of the surface shape displacement of the glass substrate in the conveyance direction during conveyance, which is obtained based on the distance measured by the non-contact displacement meter, falls within a range between the upper limit waveform and the lower limit waveform.
机译:用于检查片状构件的翘曲的设备包括:用于以大致水平的姿势传送玻璃基板的传送装置;以及用于测量到玻璃基板的表面的距离的非接触位移计。该装置被配置为基于玻璃基板在传送方向上的表面形状位移的理想波形来预设上限波形和下限波形,该理想波形是根据传送装置的特性确定的;并且,基于非接触式位移计所测定的距离,求出玻璃基板在搬运时的搬运方向上的表面形状的实际位移的实际波形是否在上述上限波形与上述上限波形之间。下限波形。

著录项

  • 公开/公告号KR20150032654A

    专利类型

  • 公开/公告日2015-03-27

    原文格式PDF

  • 申请/专利权人 NIPPON ELECTRIC GLASS CO. LTD.;

    申请/专利号KR20147018767

  • 发明设计人 TAKAHASHI TADASHI;

    申请日2013-07-22

  • 分类号G01B21/20;G01B21/32;G01B21/30;G01B11/24;G01B11/16;G01B11/30;B65G49/06;B65G13;B65G51/03;

  • 国家 KR

  • 入库时间 2022-08-21 15:00:27

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