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CHARGED PARTICLE BEAM DEVICE, POSITION ADJUSTING METHOD FOR DIAPHRAGM, AND DIAPHRAGM POSITION ADJUSTING JIG

机译:带电粒子束设备,膜片的位置调整方法和膜片的位置调整夹具

摘要

In a charged particle beam apparatus in which observation is performed under an atmospheric pressure or a gas atmosphere substantially equivalent to atmospheric pressure, the diaphragm for isolating the atmospheric pressure space in which the sample is placed and the vacuum space inside the electron optical column is very thin for the transmission of electron beams, high. When the diaphragm is exchanged, it is necessary to adjust the diaphragm position. However, according to the prior art method, it is not possible to easily adjust the diaphragm position. In a charged particle beam apparatus having a structure in which a thin film for partitioning a vacuum atmosphere and an atmosphere or a gas atmosphere is used, a space in which the sample is placed is isolated so that the pressure of the space in which the sample is placed is kept larger than the pressure inside the casing, A detachable diaphragm for transmitting or passing the charged particle beam and a movable member for moving the diaphragm while maintaining the pressure of the space in which the sample is placed and the pressure inside the casing.
机译:在其中在大气压或基本等于大气压的气体气氛下进行观察的带电粒子束装置中,用于隔离放置样品的大气压空间和电子光学柱内部的真空空间的膜片非常大。电子束的传输很薄,很高。更换膜片时,有必要调整膜片的位置。然而,根据现有技术方法,不可能容易地调节隔膜位置。在具有其中使用用于划分真空气氛和气氛或气体气氛的薄膜的结构的带电粒子束装置中,放置样品的空间是隔离的,从而样品的空间的压力保持放置的压力大于壳体内部的压力;可分离的隔膜,用于传输或通过带电粒子束;以及可移动的部件,用于在保持放置样本的空间的压力和壳体内部的压力的同时移动隔膜。

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