首页> 外国专利> GROUND STATE HYDROGEN RADICAL SOURCES FOR CHEMICAL VAPOR DEPOSITION OF SILICON-CARBON-CONTAINING FILMS

GROUND STATE HYDROGEN RADICAL SOURCES FOR CHEMICAL VAPOR DEPOSITION OF SILICON-CARBON-CONTAINING FILMS

机译:硅碳薄膜化学气相沉积的基态氢自由基源

摘要

A thin layer of a silicon-carbon-containing film is deposited on a substrate by generating hydrogen radicals from hydrogen gas supplied to a radicals generation chamber, supplying the hydrogen radicals to a substrate processing chamber separated from the radicals generation chamber via a multiport gas distributor, and reacting the hydrogen radicals therein with an organosilicon reactant introduced into the substrate processing chamber concurrently. The hydrogen radicals are allowed to be relaxed into a ground state in a radical relaxation zone within the substrate processing chamber before reacting with the organosilicon reactant.
机译:通过从供应到自由基产生室的氢气中产生氢自由基,然后通过多端口气体分配器将氢自由基提供给与自由基产生室分开的基板处理室,从而在基板上沉积一层含硅碳的薄膜。使其中的氢自由基与同时引入到基板处理室中的有机硅反应物反应。在与有机硅反应物反应之前,允许氢自由基在基板处理室内的自由基弛豫区中弛豫为基态。

著录项

  • 公开/公告号KR20150047439A

    专利类型

  • 公开/公告日2015-05-04

    原文格式PDF

  • 申请/专利权人 LAM RESEARCH CORPORATION;

    申请/专利号KR20140144392

  • 发明设计人 VARADARAJAN BHADRI N.;GONG BO;

    申请日2014-10-23

  • 分类号H01L21/205;C23C14/06;C23C14/12;

  • 国家 KR

  • 入库时间 2022-08-21 15:00:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号