首页> 外国专利> METHOD AMD SYSTEM OF DETERMINING SUITABILITY OF CORRECTION TO CONTROL LOGIC OF SELECTIVE CATALYTIC REDUCTION CATALYST

METHOD AMD SYSTEM OF DETERMINING SUITABILITY OF CORRECTION TO CONTROL LOGIC OF SELECTIVE CATALYTIC REDUCTION CATALYST

机译:确定选择性适合于选择性催化还原催化剂控制逻辑的方法和系统

摘要

The present invention relates to a method and an apparatus to determine suitability of correction of a control logic of a selective catalytic reduction catalyst capable of ensuring reliability of corrections performed in a control logic to control operation of a selective catalytic reduction catalyst. According to an embodiment of the present invention, the method to determine suitability of correction of a control logic of a selective catalytic reduction catalyst comprises: a step of calculating a suitability function of correction based on a previous error and a current error if the correction is performed; a step of calculating a suitability coefficient based on the suitability function of correction; a step of determining whether correction is appropriate based on the number of correction and the number of suitability; and a step of resetting the control logic if the correction is not appropriate.
机译:确定选择性催化还原催化剂的控制逻辑的适合性的方法和装置技术领域本发明涉及一种确定选择性催化还原催化剂的控制逻辑的适合性的方法和装置,该方法和装置能够确保在控制逻辑中进行以控制选择性催化还原催化剂的操作的校正的可靠性。根据本发明的一个实施例,确定选择性催化还原催化剂的控制逻辑的校正的适合性的方法包括:如果校正为,则基于先前误差和当前误差来计算校正的适合性函数的步骤。表演根据校正的适合度函数计算适合度系数的步骤;根据校正次数和适合度确定校正是否合适的步骤;如果校正不正确,则重置控制逻辑。

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