首页> 外国专利> METHOD AMD SYSTEM OF DETERMINING SUITABILITY OF CORRECTION TO CONTROL LOGIC OF SELECTIVE CATALYTIC REDUCTION CATALYST

METHOD AMD SYSTEM OF DETERMINING SUITABILITY OF CORRECTION TO CONTROL LOGIC OF SELECTIVE CATALYTIC REDUCTION CATALYST

机译:确定选择性适合于选择性催化还原催化剂控制逻辑的方法和系统

摘要

The present invention relates to a method and apparatus for determining the suitability of a control logic of a selective reduction catalyst which can ensure the reliability of the correction performed in the control logic that controls the operation of the selective reduction catalyst. A method of determining a suitability of a control logic of a selective reduction catalyst according to an embodiment of the present invention includes calculating a suitability function of correction based on a previous error and a current error when the correction is performed; Calculating a fitness coefficient based on the correction fitness; Determining whether correction is appropriate based on the number of times of correction and the number of times of matching; And resetting the control logic if correction is not appropriate.
机译:本发明涉及一种确定选择性还原催化剂的控制逻辑的适用性的方法和装置,该方法和设备可以确保在控制选择性还原催化剂的操作的控制逻辑中进行的校正的可靠性。根据本发明实施例的确定选择性还原催化剂的控制逻辑的适合性的方法包括:当进行校正时,基于先前的误差和当前误差来计算校正的适合性函数;以及根据校正适应度计算适应度系数;根据校正次数和匹配次数确定校正是否合适;如果校正不正确,请重置控制逻辑。

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