首页> 外国专利> PROCESS FOR ELECTRODEPOSITION OF COPPER CHIP TO CHIP, CHIP TO WAFER AND WAFER TO WAFER INTERCONNECTS IN THROUGH-SILICON VIAS(TSV) WITH HEATED SUBSTRATE AND COOLED ELECTROLYTE

PROCESS FOR ELECTRODEPOSITION OF COPPER CHIP TO CHIP, CHIP TO WAFER AND WAFER TO WAFER INTERCONNECTS IN THROUGH-SILICON VIAS(TSV) WITH HEATED SUBSTRATE AND COOLED ELECTROLYTE

机译:通过导电的基质和冷却电解质在全硅硅通孔(TSV)中电解沉积铜芯片到芯片,芯片到晶圆和晶圆到晶圆的互连过程

摘要

the present invention , holding the silicon substrate and the silicon substrate is heated to a first temperature a chuck (chuck) and a temperature controller for maintaining the temperature of the electrolytic cell to a second temperature to the first temperature adjusting { is maintained in the range of about 30 to about 60 , the second temperature is (a) at least 5 lower than the first temperature , (b) from about 15 to about 35 maintained in the range of the temperature of the delivery system including a metal plating } , the electrolytic cell comprises a redox mediator (redox mediator) (electrolytic bath) using the present invention relates to a metal via (via) the silicon through-hole (through-silicon vias) (TSV) high aspect ratio in a silicon substrate to form a (aspect ratio) in the method of electrodeposition (electrodepositing). ;
机译:在本发明中,将保持硅基板和硅基板加热到第一温度的吸盘(chuck)和用于将电解池的温度保持在第二温度的温度控制器控制在第一温度。在大约30至大约60的温度下,第二温度(a)比第一温度低至少5,(b)在包括金属镀层在内的输送系统的温度范围内保持在大约15至大约35。电解池包括氧化还原介体(redox mediator)(电解浴),使用本发明涉及的金属通孔(via)是硅衬底中的硅(硅通孔)(TSV)高纵横比,以形成电沉积(电沉积)方法中的(纵横比)。 ;

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