DEVICE FOR MEASURING CURRENTS SURFACE FILM Metal-dielectric structures UNDER THE INFLUENCE OF POWERFUL ELECTROMAGNETIC FIELDS

摘要

A device for measuring current on-film dielectric structures surfaces when exposed to powerful electromagnetic fields, comprising a waveguide, a magnetic field sensor and the recorder, characterized in that it further comprises a device for vertical movement connected with a rod, the device for moving horizontally, both devices for moving dielectric structure connected to the computer, a source of electromagnetic waves, coupled with the waveguide, in which the keeper broad wall formed from Erste.