DEVICE FOR MEASUREMENT OF CURRENTS ON SURFACES OF FILM METAL-DIELECTRIC STRUCTURE UNDER EFFECT OF POWERFUL ELECTROMAGNETIC FIELDS

摘要

A device for measurement of currents on the surface of a film metal-dielectric structure under effect of powerful electromagnetic fields comprises a waveguide, indicator of magnetic field and recorder. Additionally it comprises a device for displacement by vertical connected to a rod, and a device for displacement by horizon. Both devices for displacement of dielectric structure are connected to computer. The source of electromagnetic waves is connected to a wave guide in the wide wall of which at center an opening is provided.