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METHOD OF PRODUCING PHOTODETECTORS BASED ON EPITAXIAL GaN/AlGaN p-i-n STRUCTURES

机译:基于外延GaN / AlGaN p-i-n结构的光电检测器的制备方法

摘要

FIELD: physics.;SUBSTANCE: invention relates to photodiode technologies based on epitaxial GaN/AlGaN p-i-n structures which convert ultraviolet radiation. The invention discloses a method of producing a multi-element photodetector based on epitaxial GaN/AlxGa1-xN p-i-n structures. Production is carried out using a mesa technique of ion etching to a n+-AlGaN layer, heat-treating the surface of the mesa p-i-n diodes at 450-550°C for 90-200 s to heal radiation and stoichiometric defects formed on the perimeter the p-i-n diodes under the action of an ion beam or other surface damages arising on technological operations of producing a mesa structure.;EFFECT: reducing dark current of a multi-element photodetector.;2 dwg
机译:技术领域本发明涉及基于外延GaN / AlGaN p-i-n结构的光电二极管技术,该结构可转换紫外线辐射。本发明公开了一种基于外延GaN / Al x Ga 1-x N p-i-n结构的多元素光电探测器的制造方法。使用离子蚀刻台面技术对n + -AlGaN层进行生产,然后在450-550°C下对台面型pin二极管的表面进行90-200 s的热处理,以修复辐射和化学计量缺陷。在产生台面结构的技术操作中受到离子束或其他表面损伤的作用下产生的Pin二极管;效果:减少多元素光电探测器的暗电流; 2 dwg

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