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A method and structure for increasing the performance, and of the reduction in the nbti (negative bias temperature inst ability) of a mosfet

机译:一种用于提高性能,降低MOSFET的nbti(负温度插入能力)的方法和结构

摘要

A method for forming a field effect transistor structure (100) of the p - type (pfet), said method comprising:The formation of a mask layer (118) on a semiconductor substrate (110), wherein the mask layer (118) an opening (120) having a semiconductor region (114a) of the semiconductor substrate (110) within the opening (120) exposes;Forming a n - type - trough (n - trough) (122) in the semiconductor region (114a) by applying an ion implantation of n - - dopant type to the semiconductor substrate (110) through the opening (120) of the mask layer (118); andApplying a germanium (ge) - channel implantation to the semiconductor substrate (110) through the opening (120) of the mask layer (118), as a result of which a ge - channel implantation region (124) in the n - trough (122) is formed.
机译:一种形成p型(pfet)的场效应晶体管结构(100)的方法,所述方法包括:在半导体衬底(110)上形成掩模层(118),其中所述掩模层(118)和在开口(120)内具有半导体衬底(110)的半导体区域(114a)的开口(120)暴露;通过在半导体区域(114a)上形成一个-型-沟槽(n-沟槽)(122)通过掩模层(118)的开口(120)对半导体衬底(110)进行n-掺杂类型的离子注入;并通过掩模层(118)的开口(120)对半导体衬底(110)进行锗(ge)沟道注入,结果,n槽中的ge沟道注入区(124) 122)形成。

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