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Method for adjusting the temperature of detector elements of an X-ray device and X-ray device

机译:X射线装置的检测器元件的温度调整方法及X射线装置

摘要

For adjusting the temperature of an x-ray detector (3) comprising several juxtaposed detector elements (7i, i = 1,2 ...) of an x-ray device (1), wherein the x-ray detector (3) and / or an x-ray source (2) during the detection an X-ray image recording are moved relative to a measurement object, it is provided during the detection of the X-ray image capture one of the detector elements (7i) for the heat input into this detector element (7i) characteristic heat input dimension (Ii), and for each detector element (7i ) to take into account in each case detected heat input measure (Ii) at a temperature control of at least one other detector element (7i).
机译:为了调节包括X射线设备(1)的多个并置的检测器元件(7i,i = 1,2 ...)的X射线检测器(3)的温度,其中,X射线检测器(3)和/或在检测过程中将X射线源(2)相对于测量对象移动,该X射线源(2)在检测X射线图像期间提供,用于捕获一个检测器元件(7i)。热量输入到该检测器元件(7i)的特征热量输入尺寸(Ii),并且对于每个检测器元件(7i)在每种情况下都要考虑在至少一个其他检测器元件的温度控制下检测到的热量输入量度(Ii) (7i)。

著录项

  • 公开/公告号DE102014201741A1

    专利类型

  • 公开/公告日2015-08-20

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE201410201741

  • 发明设计人 THORSTEN ERGLER;THOMAS REICHEL;

    申请日2014-01-31

  • 分类号G01T1/29;G01T7;A61B6/03;H05G1/02;

  • 国家 DE

  • 入库时间 2022-08-21 14:55:04

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