首页> 外文期刊>Analytical chemistry >Highly Sensitive Nondestructive Rare Earth Element Detection by Means of Wavelength-Dispersive X-ray Fluorescence Spectroscopy Enabled by an Energy Dispersive pn-Charge-Coupled-Device Detector
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Highly Sensitive Nondestructive Rare Earth Element Detection by Means of Wavelength-Dispersive X-ray Fluorescence Spectroscopy Enabled by an Energy Dispersive pn-Charge-Coupled-Device Detector

机译:借助于能量分散PN-电荷耦合器检测器的波长分散X射线荧光光谱法检测高度敏感的无损稀土元素检测

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摘要

Detection of rare earth elements (REE) is commonly performed with destructive techniques such as (LA)-ICPMS or coupled to a destructive sample preparation. When investigating unique geological samples, such as cometary, asteroidal, or interstellar material from sample return missions or inclusions in deep Earth diamonds, a nondestructive method is preferred. The presented nondestructive highly sensitive wavelength-dispersive X-ray fluorescence spectroscopy (WD-XRF) technique is designed to measure the L-lines of REE between 4.5 and 7 keV with a sensitivity down to the ppm level. REE fluorescence L-lines are often only separated by a few eV from neighboring XRF-lines and cannot be resolved by an energy dispersive approach especially in the presence of transition metal K-lines. In our spectrometer the characteristic X-rays emitted by the sample are dispersed by a fixed Ge(111) analyzer crystal over the active area of an energy dispersive pn-charge-coupled-device (pnCCD) detector, enabling high energy resolution detection of X-rays differentiated by their corresponding Bragg angles. The use of an energy-dispersive 2D detector enables the simultaneous acquiring of XRF-lines while eliminating any ambiguities due to potential contribution from higher order diffraction effects or other diffraction planes and thereby increases the sensitivity by reducing the (scatter) background. This detection method shows an energy resolution of 12 eV for the Ti-K alpha fluorescence line and has a sensitivity down to 0.50 ppm for REE L-lines. The method was optimized specifically for the nondestructive analysis of inclusions in deep Earth diamonds, yielding in situ quantitative information about up-to-now inaccessible elemental (REE) composition patterns together with the more abundant transition metals like Ti, Cr, Mn, and Fe. This information is of great importance to decipher the role that deep Earth plays in the global carbon and fluid cycle.
机译:通常用破坏性技术(如(LA)-ICPMS或与破坏性样品制备偶联而进行稀土元素(REE)的检测。当研究独特的地质样品时,例如来自样品返回任务或深层地球钻石中的夹杂物中的彗星,小行星或星际材料,优选一种非破坏性方法。所提出的非破坏性高敏感波长分散X射线荧光光谱(WD-XRF)技术旨在测量4.5和7KeV之间的L-线,灵敏度下降到PPM水平。 REE荧光L-线通常仅通过来自相邻的XRF线的几个EV分离,并且不能通过能量分散方法来解决,特别是在过渡金属K线的存在下。在我们的光谱仪中,样品发射的特征X射线通过固定的GE(111)分析仪晶体在能量分散PN-电荷耦合器(PNCCD)检测器的有源区域上分散,从而实现X的高能量分辨率检测 - 通过它们相应的布拉格角差异化。使用能量分散的2D检测器使得能够同时获取XRF线,同时由于从高阶衍射效应或其他衍射平面的潜在贡献而消除任何歧义,从而通过减少(散射)背景来增加灵敏度。该检测方法显示了Ti-Kα荧光线12eV的能量分辨率,并且对于REE L线的敏感性降至0.50ppm。该方法是专门针对深土钻石中夹杂物进行无损分析的优化,屈服于与现在难以接近的元素(REE)组成图案的原位定量信息与Ti,Cr,Mn和Fe这样的更丰富的过渡金属一起。这些信息非常重视破译深层地球在全球碳和流体循环中发挥的作用。

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  • 来源
    《Analytical chemistry》 |2020年第1期|共8页
  • 作者单位

    Univ Ghent Dept Chem Xray Microspect &

    Imaging Grp Krijgslaan 281 B-9000 Ghent Belgium;

    Univ Ghent Dept Chem Xray Microspect &

    Imaging Grp Krijgslaan 281 B-9000 Ghent Belgium;

    Goethe Univ Frankfurt Inst Geosci Altenhoferallee 1 D-60438 Frankfurt Germany;

    Goethe Univ Frankfurt Inst Geosci Altenhoferallee 1 D-60438 Frankfurt Germany;

    Deutsch Elektronen Synchrotron DESY Notkestr 85 D-22607 Hamburg Germany;

    Univ Ghent Dept Chem Xray Microspect &

    Imaging Grp Krijgslaan 281 B-9000 Ghent Belgium;

    Deutsch Elektronen Synchrotron DESY Notkestr 85 D-22607 Hamburg Germany;

    Goethe Univ Frankfurt Inst Geosci Altenhoferallee 1 D-60438 Frankfurt Germany;

    Univ Ghent Dept Chem Xray Microspect &

    Imaging Grp Krijgslaan 281 B-9000 Ghent Belgium;

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  • 正文语种 eng
  • 中图分类 分析化学;
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