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DEVICE AND STRUCTURE FOR BULK FINFET TECHNOLOGY

机译:散装FINFET技术的器件和结构

摘要

A lateral double-diffused MOS (LDMOS) bulk finFET device for high-voltage operation includes a first-well region and two or more second-well regions formed on a substrate material and one or more non-well regions including substrate material. The non-well regions are configured to separate well regions of the second-well regions. A source structure is disposed on a first fin that is partially formed on the first-well region. A drain structure is disposed on a second fin that is formed on a last one of the second-well regions. One or more dummy regions are formed on the one or more non-well regions. The dummy regions are configured to provide additional depletion region flow paths including vertical flow paths for charge carriers to enable the high-voltage operation.
机译:用于高压操作的横向双扩散MOS(LDMOS)体finFET器件包括:第一阱区和两个或多个第二阱区,形成在衬底材料上;一个或多个非阱区,包括衬底材料。非阱区被配置为将第二阱区中的阱区分开。源极结构设置在部分地形成在第一阱区域上的第一鳍片上。漏极结构设置在第二鳍片上,该第二鳍片形成在第二阱区的最后一个上。在一个或多个非阱区上形成一个或多个虚设区。虚设区域被配置为提供额外的耗尽区流动路径,包括用于载流子的垂直流动路径,以使高压操作成为可能。

著录项

  • 公开/公告号EP2953168A1

    专利类型

  • 公开/公告日2015-12-09

    原文格式PDF

  • 申请/专利权人 BROADCOM CORPORATION;

    申请/专利号EP20150169215

  • 发明设计人 PONOTH SHOM;ITO AKIRA;

    申请日2015-05-26

  • 分类号H01L29/78;H01L29/66;

  • 国家 EP

  • 入库时间 2022-08-21 14:47:52

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