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A method for determining the optical properties of materials for optical measurements of structures.
A method for determining the optical properties of materials for optical measurements of structures.
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机译:一种确定用于光学测量结构的材料的光学特性的方法。
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摘要
Methods of determining a material optical property for optical metrology of a structure is described. One method includes simulating a set of diffraction orders for a grating structure based on two or more azimuth angles and on one or more angles of incidence. A simulated spectrum is provided based on the set of diffraction orders. Another method includes simulating a set of diffraction orders for a grating structure based on two or more angles of incidence. A simulated spectrum is provided based on the set of diffraction orders.
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