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Proximity Materials Identification by Simultaneous Measurement Method of Optical and Electrical Properties Based on Impedance Measurement

机译：基于阻抗测量的光学电气性质同时测量方法识别近似材料识别

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Satoshi TSUJI; Akira KIMOTO; Eiji TAKAHASHI;
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年度 2012
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Proximity Materials Identification by Simultaneous Measurement Method of Optical and Electrical Properties Based on Impedance Measurement

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