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THROUGH-WAFER INTERCONNECTS FOR MEMS DOUBLE-SIDED FABRICATION PROCESS (TWIDS)

机译:MEMS双侧制造工艺(TWIDS)的直通晶圆互连

摘要

A high-aspect ratio low resistance through-wafer interconnect for double-sided (TWIDS) fabrication of microelectromechanical systems (MEMS) serves as an interconnection method and structure for co-integration of MEMS and integrated circuits or other microcomponent utilizing both sides of the wafer. TWIDS applied to a three dimensional folded TIMU (timing inertial measurement unit) provides a path for electrical signals from sensors on the front side of the SOI wafer to electronic components on the back side of the wafer, while enabling folding of an array of sensors in a three dimensional shape.
机译:用于微机电系统(MEMS)的双面(TWIDS)制造的高纵横比低电阻直通晶片互连用作互连方法和结构,用于将MEMS与集成电路或利用晶片两面的其他微组件共同集成。应用于三维折叠式TIMU(定时惯性测量单元)的TWIDS为从SOI晶片正面上的传感器到晶片背面上的电子组件的电信号路径提供了一条路径,同时能够折叠传感器阵列。三维形状。

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