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COMBINED RANK AND LINEAR ADDRESS INCREMENTING UTILITY FOR COMPUTER MEMORY TEST OPERATIONS
COMBINED RANK AND LINEAR ADDRESS INCREMENTING UTILITY FOR COMPUTER MEMORY TEST OPERATIONS
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机译:计算机内存测试操作的组合范围和线性地址递增效用
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摘要
Embodiments include a combined rank and linear memory address incrementing utility. An aspect includes an address incrementing utility suitable for implementation within a memory controller as an integrated subsystem of a central processing unit (CPU) chip. In this type of on-chip embodiment, the address incrementing utility utilizes dedicated hardware, chip-resident firmware, and one or more memory address configuration maps to enhance processing speed, efficiency and accuracy. The combined rank and linear memory address incrementing utility is designed to efficiently increment through all of the individual bit addresses for a large logical memory space divided into a number of ranks on a rank-by-rank basis. The address incrementing utility sequentially generates all of the sequential memory addresses for a selected rank, and then moves to the next rank and sequentially generates all of the memory addresses for that rank, and so forth until of the ranks have been processed.
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