首页> 外国专利> ICP SOURCE DESIGN FOR PLASMA UNIFORMITY AND EFFICIENCY ENHANCEMENT

ICP SOURCE DESIGN FOR PLASMA UNIFORMITY AND EFFICIENCY ENHANCEMENT

机译:等离子体均匀性和效率增强的ICP源设计

摘要

An ICP A plasma reactor having an enclosure wherein at least part of the ceiling forms a dielectric window. A substrate support is positioned within the enclosure below the dielectric window. An RF power applicator is positioned above the dielectric window to radiate RF power through the dielectric window and into the enclosure. A plurality of gas injectors are distributed uniformly above the substrate support to supply processing gas into the enclosure. A circular baffle is situated inside the enclosure and positioned above the substrate support but below the plurality of gas injectors so as to redirect the flow of the processing gas.
机译:一种具有外壳的ICP等离子体反应器,其中至少一部分顶板形成电介质窗口。衬底支撑件位于电介质窗口下方的外壳内。射频功率施加器位于介电窗口上方,以通过介电窗口辐射射频功率并进入外壳。多个气体喷射器均匀地分布在基板支架上方,以将处理气体供应到外壳中。圆形挡板位于外壳内部,并位于基板支撑件上方,但位于多个气体注入器下方,以便重新定向处理气体的流动。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号