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ICP source design for plasma uniformity and efficiency enhancement

机译:ICP源设计可提高等离子体均匀性和效率

摘要

An ICP A plasma reactor having an enclosure wherein at least part of the ceiling forms a dielectric window. A substrate support is positioned within the enclosure below the dielectric window. An RF power applicator is positioned above the dielectric window to radiate RF power through the dielectric window and into the enclosure. A plurality of gas injectors are distributed uniformly above the substrate support to supply processing gas into the enclosure. A circular baffle is situated inside the enclosure and positioned above the substrate support but below the plurality of gas injectors so as to redirect flow of the processing gas.
机译:一种具有外壳的ICP等离子体反应器,其中至少一部分顶板形成电介质窗口。衬底支撑件位于电介质窗口下方的外壳内。射频功率施加器位于介电窗口上方,以通过介电窗口辐射射频功率并进入外壳。多个气体喷射器均匀地分布在基板支架上方,以将处理气体供应到外壳中。圆形挡板位于外壳内部,并位于基板支撑件上方但在多个气体喷射器下方,以便重新引导处理气体的流动。

著录项

  • 公开/公告号US9095038B2

    专利类型

  • 公开/公告日2015-07-28

    原文格式PDF

  • 申请/专利权人 SHI GANG;SONGLIN XU;TUQIANG NI;

    申请/专利号US201113337248

  • 发明设计人 TUQIANG NI;SHI GANG;SONGLIN XU;

    申请日2011-12-26

  • 分类号C23F1/00;H05H1/30;H01L21/3065;H01J37/32;

  • 国家 US

  • 入库时间 2022-08-21 15:18:32

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