首页>
外国专利>
On-chip test technique for low drop-out regulators
On-chip test technique for low drop-out regulators
展开▼
机译:低压降稳压器的片上测试技术
展开▼
页面导航
摘要
著录项
相似文献
摘要
A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.
展开▼