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CIRCUIT DIVISION METHOD FOR TEST PATTERN GENERATION AND CIRCUIT DIVISION DEVICE FOR TEST PATTERN GENERATION
CIRCUIT DIVISION METHOD FOR TEST PATTERN GENERATION AND CIRCUIT DIVISION DEVICE FOR TEST PATTERN GENERATION
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机译:用于生成测试图案的电路划分方法以及用于生成测试图案的电路划分设备
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摘要
A circuit division method for test pattern generation in which a computer performs processes of: acquiring, for each of a plurality of blocks included in a target circuit for test pattern generation, a first feature amount regarding a size of each block and a second feature amount regarding a function of the block; classifying the plurality of blocks into a plurality of groups so that blocks for which the acquired first feature amount is within a first predetermined range and the acquired second feature amount is within a second predetermined range belong to an identical group; and assigning, for each of the classified groups, each of the blocks included in the group to one of a plurality of divided circuits of a division number based on a ratio of the number of blocks included in the group to the division number by which the plurality of blocks are divided.
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