The test pattern generation device and the circuit design device, the test pattern generation method, circuit design manner, being the test pattern generation device which generates the test pattern

摘要

PROBLEM TO BE SOLVED: To provide a test pattern producing apparatus, a circuit design apparatus, a test pattern producing method, a circuit design method, a test pattern producing program, and a circuit design program, for reducing the processing time in test pattern production and the amount of memory used.;SOLUTION: This test pattern producing device is equipped with a circuit data read part 11 for dividing circuit data into a plurality of functional blocks; an association table preparing part 12 for classifying the plurality of functional blocks into test pattern producing object blocks and test pattern duplicating object blocks, which are functional blocks having the same structure as the producing object blocks to make them associate with each other; a test pattern producing part 13 for producing test patterns for the producing object blocks; and a test pattern duplicating part 14 for duplicating the test patterns for the producing object blocks, to obtain test patterns for the duplicating object blocks.;COPYRIGHT: (C)2006,JPO&NCIPI