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PARAMETER CONTROL METHOD FOR INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT USING THE SAME

机译:集成电路的参数控制方法及使用该参数的集成电路

摘要

A parameter control method for an integrated circuit and an integrated circuit using the same are provided. The method includes the steps of: providing a correspondence between 1st to Nth impedance groups and 1st to Nth first settings, wherein each impedance group includes K sub impedances; providing a correspondence between 1st to Kth sub-impedance and 1st to Kth second settings; detecting an impedance from a specific pin of the integrated circuit; comparing an impedance detected from the specific pin of the integrated circuit with the 1st to Nth impedance sets to find a corresponding specific impedance set to select a specific first setting; comparing the impedance detected from the specific pin of the integrated circuit with the 1st to Kth sub-impedance of the specific impedance set to select a specific second setting; and operating the integrated circuit according to the specific first setting and the specific second setting.
机译:提供了一种用于集成电路的参数控制方法和使用该方法的集成电路。该方法包括以下步骤:提供第1 st 到第N 阻抗组与第1 到第N 第一设置,其中每个阻抗组包括K个子阻抗;提供第1 st 到第K 子阻抗与1 到第K 秒设置之间的对应关系;从集成电路的特定引脚检测阻抗;比较从集成电路的特定引脚检测到的阻抗与第一至第N 阻抗集,以找到相应的特定阻抗集,以选择特定的第一设置;比较从集成电路的特定引脚检测到的阻抗与特定阻抗设置的第1 st 至K 子阻抗,以选择特定的第二设置;根据特定的第一设置和特定的第二设置操作集成电路。

著录项

  • 公开/公告号US2016156359A1

    专利类型

  • 公开/公告日2016-06-02

    原文格式PDF

  • 申请/专利权人 NOVELTEK SEMICONDUCTOR CORPORATION;

    申请/专利号US201514715192

  • 发明设计人 TSO-MIN CHEN;RONG-JIE TU;

    申请日2015-05-18

  • 分类号H03L5/02;G01R31/04;

  • 国家 US

  • 入库时间 2022-08-21 14:34:23

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