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INAS/ALSB/GASB based type-II SL pin detector with P on N and N on P configurations
INAS/ALSB/GASB based type-II SL pin detector with P on N and N on P configurations
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机译:基于INAS / ALSB / GASB的II型SL引脚检测器,N上为P,P上为N
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摘要
Novel N-structured In As/Al Sb(Al Ga Sb)/Ga Sb based type-II SL pin detector with p on n and n on p configurations are given to detect light in the Mid Wavelength Infrared Range—MWIR with a cut-off wavelength of 5 μm. Better carrier confinements are performed by placing AlSb layers switching from InAs layers to Ga Sb layers successively in the growth direction throughout the SL pin diode where zero bias detectivity is improved as 6×1013 A/Hz1/2 at a wavelength of 4.2 μm at 79K. RoA value is measured as 1.8×106 Ωcm2 which is better than nBn devices. Dark current density is also obtained in the range of 4-7×10−7 A/cm at zero bias and Vb=0.3V respectively at 79K.
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机译:给出了基于N结构的In / As S / Al Sb(Al Ga Sb)/ Ga Sb的II型SL引脚探测器,具有p于n和n于p的配置,以检测中波长红外范围的光-MWIR截止波长为5μm。通过在整个SL pin二极管上沿生长方向依次放置从InAs层切换到Ga Sb层的AlSb层来实现更好的载流子限制,其中零偏压检测率提高为6×10 13 Sup> A / Hz 1/2 Sup>,在79K波长下为4.2μm。 RoA值测量为1.8×10 6 Sup>Ωcm 2 Sup>,比nBn器件好。在零偏压下,在79K时,暗电流密度分别在4-7×10 −7 Sup> A / cm的范围内获得。
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