首页> 外国专利> Resistance change memory device having threshold switching and memory switching characteristics, method of fabricating the same, and resistance change memory device including the same

Resistance change memory device having threshold switching and memory switching characteristics, method of fabricating the same, and resistance change memory device including the same

机译:具有阈值切换和存储器切换特性的电阻变化存储装置,其制造方法以及包括该电阻变化存储装置的电阻变化存储装置

摘要

Disclosed are a resistance change memory device, a method of fabricating the same, and a resistance change memory array including the same. The resistance change memory device includes a first electrode and a second electrode. A hybrid switching layer is interposed between the first electrode and the second electrode. The hybrid switching layer is a metal oxide layer having both threshold switching characteristics and memory switching characteristics.
机译:公开了一种电阻变化存储器件,其制造方法以及包括其的电阻变化存储阵列。电阻变化存储器件包括第一电极和第二电极。混合开关层介于第一电极和第二电极之间。混合开关层是同时具有阈值开关特性和存储器开关特性的金属氧化物层。

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