首页> 外国专利> Fixture for flattening sample in optical metrology

Fixture for flattening sample in optical metrology

机译:光学计量中用于平整样品的夹具

摘要

A vacuum mechanism for flattening bowed panel samples includes a support structure with coplanar support elements and a fixture with a movable component actuated by a vacuum source. The movable component has a top surface disposed above the support elements when no vacuum is applied and is capable of being drawn to a substantially coplanar position with the support elements when actuated by the vacuum source. The top surface is fluidly connected to the vacuum source and adapted to adhere to the overlaying surface of the sample when vacuum is applied, thereby flattening the sample when the movable component is drawn in by the same vacuum source.
机译:用于使弓形板样品变平的真空机构包括具有共面支撑元件的支撑结构和具有由真空源致动的可移动部件的固定装置。当不施加真空时,可移动部件具有布置在支撑元件上方的顶表面,并且当由真空源致动时,可移动部件能够被拉至与支撑元件基本共面的位置。顶表面流体地连接到真空源,并适于在施加真空时粘附到样品的覆盖表面,从而当可移动部件被同一真空源吸入时使样品变平。

著录项

  • 公开/公告号US9303631B1

    专利类型

  • 公开/公告日2016-04-05

    原文格式PDF

  • 申请/专利权人 BRYAN GUENTHER;

    申请/专利号US201313798865

  • 发明设计人 BRYAN GUENTHER;

    申请日2013-03-13

  • 分类号F04B7/00;B30B1/38;G03B27/20;

  • 国家 US

  • 入库时间 2022-08-21 14:28:21

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号