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PIXEL STRUCTURE FOR IMPROVING BAD DETECTION RATE, AND DETECTION METHOD
PIXEL STRUCTURE FOR IMPROVING BAD DETECTION RATE, AND DETECTION METHOD
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机译:改善不良检测率的像素结构及检测方法
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摘要
A pixel structure for improving a bad detection rate, and a detection method. The pixel structure for improving a bad detection rate comprises two regions, i.e. a primary pixel (10) and a secondary pixel (20), wherein there are a charge sharing thin film transistor (T3) and a charge sharing capacitor (CST3) in the secondary pixel (20); a gate electrode of the charge sharing thin film transistor (T3) is electrically connected to a charge sharing scanning line (Gate2(m)); the charge sharing capacitor (CST3) is constituted by an ITO layer upper electrode plate (42), a metal layer lower electrode plate (2) and an insulation layer (3) which is clamped between the ITO layer upper electrode plate (42) and the metal layer lower electrode plate (2); and the ITO layer upper electrode plate (42) and an ITO pixel electrode (41) are located on the same layer, and the ITO layer upper electrode plate (42) serves as a common pixel electrode and is connected to a common voltage signal line (Com(m)), and the metal layer lower electrode plate (2) is connected to a drain electrode of the charge sharing transistor (T3).
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