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PIXEL STRUCTURE AND DETECTION METHOD OF PROMOTING DEFECT DETECTION RATE
PIXEL STRUCTURE AND DETECTION METHOD OF PROMOTING DEFECT DETECTION RATE
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机译:提高缺陷检测率的像素结构和检测方法
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摘要
The present invention provides a pixel structure and a detection method of promoting defect detection rate. The pixel structure of promoting defect detection rate comprises two areas of a main pixel (10) and a sub pixel (20), and the sub pixel (20) comprises a charge sharing thin film transistor (T3) and a charge sharing capacitor (CST3); a gate of the charge sharing thin film transistor (T3) is electrically coupled to a charge sharing scan line (Gate2(m)); the charge sharing capacitor (CST3) is constructed by an ITO layer upper electrode plate (42), a metal lower electrode plate (2) and an insulative layer (3) sandwiched between the ITO layer upper electrode plate (42) and the metal lower electrode plate (2); the ITO layer upper electrode plate (42) and an ITO pixel electrode (41) are in a same layer, and the ITO layer upper electrode plate (42) is employed as a pixel common electrode coupled to a common voltage signal line (Com(m)), and the metal lower electrode plate (2) is coupled to a drain of the charge sharing thin film transistor (T3).
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