首页> 外国专利> METHOD FOR FORMING P-TYPE SEMICONDUCTOR THIN FILM STRUCTURE AND METHOD FOR MANUFACTURING P-TYPE OHMIC ELECTRODE USING SAME

METHOD FOR FORMING P-TYPE SEMICONDUCTOR THIN FILM STRUCTURE AND METHOD FOR MANUFACTURING P-TYPE OHMIC ELECTRODE USING SAME

机译:形成p型半导体薄膜结构的方法和用相同的方法制造p型欧姆电极的方法

摘要

In a method for forming a p-type semiconductor thin film structure, a substrate, of which a semi-polar or non-polar plane is exposed, is prepared. A first semiconductor thin film having a first surface roughness is formed on the plane by supplying a group III metal source and a nitrogen source having a first flow rate at a first temperature. Then, a second semiconductor thin film, having a second surface roughness greater than the first surface roughness, is formed on the first semiconductor thin film by supplying the group III metal source and a nitrogen source having a second flow rate less than the first flow rate.
机译:在用于形成p型半导体薄膜结构的方法中,准备暴露了半极性或非极性平面的基板。通过在第一温度下供应具有第一流速的III族金属源和氮源,在平面上形成具有第一表面粗糙度的第一半导体薄膜。然后,通过提供III族金属源和第二流速小于第一流速的氮源,在第一半导体薄膜上形成第二表面粗糙度大于第二表面粗糙度的第二半导体薄膜。 。

著录项

  • 公开/公告号WO2016098978A1

    专利类型

  • 公开/公告日2016-06-23

    原文格式PDF

  • 申请/专利权人 KOREA UNIVERSITY RESEARCH AND BUSINESS;

    申请/专利号WO2015KR07077

  • 发明设计人 SEONG TAE YEON;KIM SUNG KI;

    申请日2015-07-08

  • 分类号H01L33;H01L33/36;

  • 国家 WO

  • 入库时间 2022-08-21 14:17:26

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