首页> 外国专利> WAVEFRONT DISTORTION AMOUNT MEASUREMENT DEVICE, WAVEFRONT CORRECTION DEVICE, AND OPTICAL MEASUREMENT DEVICE AND METHOD

WAVEFRONT DISTORTION AMOUNT MEASUREMENT DEVICE, WAVEFRONT CORRECTION DEVICE, AND OPTICAL MEASUREMENT DEVICE AND METHOD

机译:波前畸变量测量装置,波前校正装置以及光学测量装置和方法

摘要

A wavefront distortion amount measurement device according to the present invention is provided with: a wavefront modulator (14, 30, 130, 230) disposed at the pupil plane of a lens (21, 29, 229) or in a position conjugate to the pupil plane, an optical detector (23, 32, 132, 232) for detecting the intensity distribution of incident light having passed through the wavefront modulator and lens, a control means for controlling the phase modulation amount of the wavefront modulator, an interference component acquisition means for acquiring an interference component of light having passed through a prescribed area and light other than the light having passed through the prescribed area on the basis of the intensity distribution obtained by the optical detector when the phase modulation amount applied to the prescribed area by the wavefront modulator is changed, and a wavefront distortion amount calculation means for applying the Fourier transform to the interference component and calculating the phase component of the interference component having had the Fourier transform applied thereto as a wavefront distortion amount. The above configuration makes it possible to accurately and quickly measure and correct wavefront distortion. A wavefront distortion amount measurement device according to the present invention can be suitably applied to an optical correction device that corrects wavefront distortion or an optical measurement device that corrects wavefronts and carries out measurement.
机译:本发明的波前畸变量测定装置具备:波前调制器(14、30、130、230),其配置在透镜(21、29、229)的光瞳面上或与该光瞳共轭的位置。平面,用于检测已经通过波前调制器和透镜的入射光的强度分布的光学检测器(23、32、132、232),用于控制波前调制器的相位调制量的控制装置,干涉分量获取装置当通过波前将调相量施加到规定区域时,基于由光检测器获得的强度分布,获得通过规定区域的光和通过规定区域的光以外的光的干涉分量。改变调制器,并且波前失真量计算装置用于将傅立叶变换应用于干扰分量和计算。 g已对其施加傅里叶变换的干涉分量的相位分量作为波前失真量。以上配置使得可以准确且快速地测量和校正波前失真。根据本发明的波前畸变量测量装置可以适当地应用于校正波前畸变的光学校正装置或校正波前并进行测量的光学测量装置。

著录项

  • 公开/公告号WO2016104223A1

    专利类型

  • 公开/公告日2016-06-30

    原文格式PDF

  • 申请/专利权人 RIKEN;

    申请/专利号WO2015JP84955

  • 发明设计人 ISOBE KEISUKE;MIDORIKAWA KATSUMI;

    申请日2015-12-14

  • 分类号G01M11/02;G01J9/02;G01N21/64;G02F1/39;

  • 国家 WO

  • 入库时间 2022-08-21 14:17:21

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