SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING LOCAL ELECTRICAL POTENTIAL FIELDS

摘要

The invention relates to a scanning probe microscope and a method for measuring local electrical potential fields. According to the invention, a scanning probe microscope is provided, on the tip of which a quantum dot is applied. This permits an increase in the resolution and sensitivity in the measuring of electrical potential fields. In the method according to the invention the applied voltage is determined, wherein a charge change of the quantum dot occurs. According to the invention, the resolution is no longer dependent on the distance of the tip from the sample to be investigated, nor on the radius if the tip.