首页> 外国专利> ELECTRICAL CHARACTERISTIC MEASUREMENT DEVICE, ELECTRICAL CHARACTERISTIC MEASUREMENT SYSTEM, ELECTRICAL CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRICAL CHARACTERISTIC MEASUREMENT PROGRAM FOR CAUSING COMPUTER TO IMPLEMENT SAID METHOD

ELECTRICAL CHARACTERISTIC MEASUREMENT DEVICE, ELECTRICAL CHARACTERISTIC MEASUREMENT SYSTEM, ELECTRICAL CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRICAL CHARACTERISTIC MEASUREMENT PROGRAM FOR CAUSING COMPUTER TO IMPLEMENT SAID METHOD

机译:电气特征测量装置,电气特征测量系统,电气特征测量方法和电气特征测量程序,用于使计算机实施实施方法

摘要

The present invention makes highly accurate electrical measurement possible regardless of the performance, and the like, of a measurement instrument. Provided is an electrical characteristic measurement device provided with a measurement unit for measuring an electrical characteristic of a biological sample at a plurality of frequencies and an allocation unit for allocating a number of measurements and/or a measurement amplitude to each frequency. When the electrical characteristic of the biological sample is measured, within the plurality of frequencies, frequencies that make the signal-to-noise ratio low and those that make the signal-to-noise ratio high are intentionally mixed, and as a result, highly accurate electrical measurement optimized for the purpose of the measurement is possible.
机译:本发明使得高精度的电测量成为可能,而与测量仪器的性能等无关。提供一种电特性测量装置,该电特性测量装置包括用于在多个频率下测量生物样本的电特性的测量单元以及用于向每个频率分配多个测量值和/或测量幅度的分配单元。当测量生物样品的电特性时,在多个频率内,有意地混合了使信噪比低的频率和使信噪比高的频率,并且因此,高频率为测量目的而优化的精确电测量是可能的。

著录项

  • 公开/公告号WO2016132779A1

    专利类型

  • 公开/公告日2016-08-25

    原文格式PDF

  • 申请/专利权人 SONY CORPORATION;

    申请/专利号WO2016JP50911

  • 发明设计人 HIDAKA ISAO;

    申请日2016-01-14

  • 分类号G01N27/02;G01N27/22;

  • 国家 WO

  • 入库时间 2022-08-21 14:16:49

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