首页> 外国专利> ELECTRICAL CHARACTERISTIC MEASUREMENT DEVICE, ELECTRICAL CHARACTERISTIC MEASUREMENT SYSTEM, ELECTRICAL CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRICAL CHARACTERISTIC MEASUREMENT PROGRAM FOR CAUSING COMPUTER TO IMPLEMENT SAID METHOD

ELECTRICAL CHARACTERISTIC MEASUREMENT DEVICE, ELECTRICAL CHARACTERISTIC MEASUREMENT SYSTEM, ELECTRICAL CHARACTERISTIC MEASUREMENT METHOD, AND ELECTRICAL CHARACTERISTIC MEASUREMENT PROGRAM FOR CAUSING COMPUTER TO IMPLEMENT SAID METHOD

机译:电气特征测量装置,电气特征测量系统,电气特征测量方法和电气特征测量程序,用于使计算机实施实施方法

摘要

A technology is provided that enables high accuracy electrical measurement regardless of the performance and/or the like of a measurement device.;There is provided an electrical characteristic measurement apparatus, at least including: a measurement unit that measures an electrical characteristic of a biological sample in a plurality of frequencies; and an assignment unit that performs assignment of a number of measurements and/or a measurement amplitude for each frequency. Use of a combination of a frequency for which the SNR is intentionally left low and a frequency for which the SNR is on the contrary improved when an electrical characteristic of a biological sample is measured in multiple frequencies, can provide, as a result, high accuracy electrical measurement optimal for the purpose of measurement.
机译:提供了一种技术,该技术能够与测量装置的性能等无关地进行高精度的电测量。所提供的电特性测量装置至少包括:测量单元,其测量生物样品的电特性。以多种频率以及分配单元,其对每个频率执行多个测量和/或测量幅度的分配。结果,当以多个频率测量生物样本的电特性时,有意将SNR降低的频率和相反将SNR改善的频率的组合使用可以提供高精度电气测量最适合测量目的。

著录项

  • 公开/公告号EP3260852A1

    专利类型

  • 公开/公告日2017-12-27

    原文格式PDF

  • 申请/专利权人 SONY CORPORATION;

    申请/专利号EP20160752168

  • 发明设计人 HIDAKA ISAO;

    申请日2016-01-14

  • 分类号G01N27/02;G01N27/22;

  • 国家 EP

  • 入库时间 2022-08-21 13:15:26

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