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SYSTEMS AND METHODS FOR SUPER-RESOLUTION SURFACE-LAYER MICROSCOPY USING MAGNETIC RESONANCE
SYSTEMS AND METHODS FOR SUPER-RESOLUTION SURFACE-LAYER MICROSCOPY USING MAGNETIC RESONANCE
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机译:利用磁共振超分辨表面层显微镜的系统和方法
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摘要
Systems and methods for using and exploiting the effect of electromagnetic field distortions (skin effect) induced by conductive or semi-conductive materials or phases of matter in order to excite and detect spins at specific depths within such matter, with a selectivity of approximately 0.25δ. This technique allows the acquisition of a depth profile of a conductor with a resolution far exceeding that of any MRI experiment and without the use of external magnetic field gradients, thus it is appropriately called a super-resolution methodology. Furthermore, the sequence can be combined with other MR sequences or imaging techniques to take depth-dependent measurements. At the heart of these super-resolution techniques lie not just the principle of reciprocity as formulated within the context of magnetic resonance, but also the specific dependence of the signal phases in response to propagation within conductive media.
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