Systems and methods for super-resolution surface-layer microscopy using magnetic resonance

摘要

A method of probing the layers above, at, and below the surface of a conducting region includes exciting nuclear or electronic spins within the conducting region using a first frequency, receiving a second frequency from the conducting region, determining the length scales by the conductivity of the conducting region, the first frequency, and the second frequency, obtaining a depth profile of the conducting region, and indirectly measuring the presence of the surface by characterizing signal distortions above the surface.