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METHODS OF PREPARING THIN FILMS BY ATOMIC LAYER DEPOSITION USING HAFNIUM AND ZIRCONIUM-BASED PRECURSORS

机译:HA和锆基前驱体原子层沉积制备薄膜的方法

摘要

by atomic layer deposition on a metal-containing film forming method it is provided. The method includes passing at least one precursor to a substrate, the structure of one or more precursors are shown in formula II: Where, M is Hf or Zr, and; R is C 1 -C 6 alkyl; n is 0, 1, 2, 3, 4, or 5; L, C 1 -C 6 is alkoxy. Further, by liquid injection atomic layer deposition is provided a method of forming a film containing metal. The method includes passing at least one precursor to a substrate, the structure of the at least one precursor, such as formulas III, the metal-containing film-forming method: Where, M is Hf or Zr, and; R is C 1 -C 6 alkyl; n is 0, 1, 2, 3, 4, or 5; L is amino, wherein amino is optionally independently C 1 -C 6 alkyl is optionally substituted once or twice.
机译:本发明提供了通过在含金属的膜形成方法上进行原子层沉积的方法。该方法包括使至少一种前体到达基底,一种或多种前体的结构显示在式II中:其中,M是Hf或Zr,和; R为C 1 -C 6 烷基; n为0、1、2、3、4或5; L,C 1 -C 6 是烷氧基。此外,通过液体注入提供了原子层沉积的形成包含金属的膜的方法。该方法包括将至少一种前体传递至基材,该至少一种前体的结构,例如式III,含金属的成膜方法:其中,M为Hf或Zr,和; R为C 1 -C 6 烷基; n为0、1、2、3、4或5; L是氨基,其中氨基任选地独立地为C 1 -Sub 1 -C 6的烷基任选地被取代一次或两次。

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