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OPTICAL ASSEMBLY, IN PARTICULAR PLASMA LIGHT SOURCE OR EUV LITHOGRAPHY SYSTEM

机译:光学组件,特别是等离子体光源或EUV光刻系统

摘要

the invention the optical assembly, in particular a plasma source (1 ') or of the EUV lithography system will, which is inside the housing space (3) surrounding the housing (2), the housing (2) in the a vacuum generating unit for generating a vacuum, one or more surfaces (13) disposed in said housing interior (3), the cleaning device 15 for removing the contaminated material (14) deposited on said surface (13), and the the surface comprises a monitoring device 25 to monitor 13, the monitoring device 25 has an optical monitoring unit 26 that can be oriented toward the surface (13). The cleaning device 15 is configured to remove CO 2 for CO 2 pellets (17) form the deposited contaminants 14 by discharged. ;
机译:在本发明中,光学组件,特别是等离子体源(1')或EUV光刻系统将在真空产生单元中的包围壳体(2)的壳体空间(3)内部,壳体(2)为了产生真空,一个或多个表面(13)设置在所述壳体内部(3)中,清洁装置15用于去除沉积在所述表面(13)上的污染材料(14),并且该表面包括监测装置25为了监控器13,监控装置25具有光学监控单元26,其可以朝向表面(13)定向。清洁装置15被配置为去除CO 2 ,因为CO 2 小球(17)通过排放而形成沉积的污染物14。 ;

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