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Methods of forming dual damascene metal interconnect structures using multi-hard masks

机译:使用多硬掩模形成双镶嵌金属互连结构的方法

摘要

provides a method of manufacturing a metal wiring structure of the present invention, a dual damascene. Method of manufacturing a metal wiring structure of a dual damascene of the present invention is to form a hard mask layer including a laminated structure of at least four insulating material layer on an insulating film on an integrated circuit substrate, and the insulating film, the hard mask layer is at least first and second insulating defined as first and second layer of insulating material, each comprising a material, at least a third and a fourth insulating material on the third and fourth layer of insulating material each of which includes, spaced from each other trench, and including the via pattern, and comprises selectively etching the insulating film along the shape of the trench and the via pattern the hard mask layer as an etch mask. ;
机译:提供一种制造本发明的金属布线结构的方法,该金属布线结构为双金属镶嵌。本发明的双镶嵌的金属布线结构的制造方法是形成硬掩模层,该硬掩模层包括在集成电路基板上的绝缘膜上的至少四个绝缘材料层的层叠结构,以及该绝缘膜,掩模层是至少第一绝缘层和第二绝缘层,其被定义为第一绝缘材料层和第二绝缘材料层,每个绝缘层包括一种材料,在第三绝缘材料层和第四绝缘材料层上的至少第三绝缘材料和第四绝缘材料分别与每个绝缘层隔开另一沟槽包括通孔图案,并且包括沿着沟槽和通孔图案的形状选择性地蚀刻绝缘膜,硬掩模层作为蚀刻掩模。 ;

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