首页> 外国专利> THIN STRUCTURE, OPTICAL ELEMENT, BRIGHTENING FILM, WATER-RESISTANT FILM, SUBSTRATE FOR MASS SPECTROMETRY, PHASE PLATE, METHOD FOR PRODUCING THIN STRUCTURE AND METHOD FOR SEARCHING

THIN STRUCTURE, OPTICAL ELEMENT, BRIGHTENING FILM, WATER-RESISTANT FILM, SUBSTRATE FOR MASS SPECTROMETRY, PHASE PLATE, METHOD FOR PRODUCING THIN STRUCTURE AND METHOD FOR SEARCHING

机译:薄结构,光学元件,增亮膜,防水膜,用于质谱分析的基质,相板,制备薄结构的方法和搜索方法

摘要

1. A thin structure containing numerous conical sections on its surface, while: conical sections have a mesostructure; the mesostructure contains a structure having mesopores. 2. The fine structure of claim 1, wherein when the length of the bottom line of the conical sections is indicated by D and the height of the conical sections is indicated by H, the H / D ratio is 1/2 or more. 3. The fine structure of claim 1, wherein the conical sections are 50 nm or more high. The fine structure according to claim 1, in which the average interval p between the vertices of the conical sections adjacent to each other is 400 nm or less. The fine structure according to claim 1, in which, when the average interval between the vertices of the conical sections adjacent to each other is denoted by p and the standard deviation of the distribution of the intervals between the vertices is denoted by σ, the following expression is satisfied 1: 0.1 σ / p 0, 5 (Expression 1) .6. The fine structure according to claim 1, in which the inner space of the mesopores is empty. The fine structure of claim 1, wherein one of the organic material and inorganic material is present in the mesopores. The fine structure of claim 7, wherein the inorganic material is present in the mesopores, and wherein the inorganic material contains any of silicon oxide, zirconium oxide, and titanium oxide. The fine structure of claim 1, wherein the mesopores are cylindrical. 10. The fine structure of claim 1, wherein the mesopores are periodically located, and upon X-ray diffraction analysis, the structure showed a diffraction peak corresponding to a structural period of 1.0 nm or greater. The fine structure of claim 1, wherein the wall portion forming the mesopores is formed by any of silicon oxide, zirconium oxide, and titanium oxide. Thin
机译:1.薄结构,在其表面上包含许多圆锥形截面,而:圆锥形截面具有介观结构;介孔结构包含具有介孔的结构。 2.根据权利要求1所述的精细结构,其中,当所述圆锥形部分的底线的长度由D表示并且所述圆锥形部分的高度由H表示时,所述H / D比为1/2以上。 3.根据权利要求1所述的精细结构,其中,所述圆锥形部分的高度为50nm以上。 2.根据权利要求1所述的微细结构,其中,彼此相邻的所述圆锥形部的顶点之间的平均间隔p为400nm以下。 2.根据权利要求1所述的微细结构,其中,当彼此相邻的圆锥形截面的顶点之间的平均间隔由p表示并且所述顶点之间的间隔的分布的标准偏差由σ表示时,以下:满足表达式1:0.1 <σ/ p <0,5(表达式1).6。 2.根据权利要求1所述的微细结构,其中,所述中孔的内部空间是空的。 2.根据权利要求1所述的微细结构,其中,所述中孔中存在有机材料和无机材料中的一种。 8.根据权利要求7所述的微细结构,其中,所述无机材料存在于所述中孔中,并且其中,所述无机材料包含氧化硅,氧化锆和氧化钛中的任何一种。 2.根据权利要求1所述的精细结构,其中,所述中孔是圆柱形的。 10.根据权利要求1所述的精细结构,其中,所述中孔周期性地定位,并且在X射线衍射分析中,所述结构显示出对应于1.0nm或更大的结构周期的衍射峰。 2.根据权利要求1所述的精细结构,其中,形成所述中孔的壁部由氧化硅,氧化锆和氧化钛中的任一种形成。瘦

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